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Type: 
Journal
Description: 
The perturbation behaviour of Ohmic and Schottky CdTe detectors under strong optical pulses is investigated. To this scope, the electric field profiles and the induced charge transients are measured, thus simultaneously addressing fixed and free charges properties, interrelated by one-carrier trapping. The results elucidate the different roles of the contacts and deep levels, both under dark and strong irradiation conditions, and pave the way for the improvement of detector performance control under high X-ray fluxes.
Publisher: 
AIP Publishing LLC
Publication date: 
17 Nov 2014
Authors: 

Adriano Cola, Isabella Farella

Biblio References: 
Volume: 105 Issue: 20 Pages: 203501
Origin: 
Applied Physics Letters