Alessandro Leone, Gabriele Rescio, Pietro Siciliano, Alessandra Papetti, Agnese Brunzini, Michele Germani
Biblio references: Pages: 1-5
Origin: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Rodolfo A Rodriguez-Davila, Richard A Chapman, Massimo Catalano, Manuel Quevedo-Lopez, Chadwin D Young
Origin: 2020 IEEE International Reliability Physics Symposium (IRPS)
Maria Assunta Signore, Giulio Malucelli, Donatella Duraccio, Chiara De Pascali, Ambra Fioravanti, Pietro Siciliano, Luca Francioso
Biblio references: Volume: 56 Issue: 1 Pages: 36
Origin: Multidisciplinary Digital Publishing Institute Proceedings
A Colombelli, MG Manera, D Lospinoso, VM Paradiso, F Longobardi, L Tommasi, R Rella
Biblio references:
Origin: ICOP 2020. Italian Conference on Optics and Photonics
